Speed up your R&D and resolve yield challenges with our advanced tools for semiconductor process control & failure analysis:

• Fault isolation from µm down to n3 with nanoprobing, current imaging, and EBIC/EBAC/RCI

• Physical failure analysis with ex-situ and in-situ lift-out

• SEM-AFM, e-beam lithography, & microcleaning

Discover new insights in surface & nanoscience using our wide range of SEM based tools for:

• Point-and-click nanomanipulation, APT, & TEM sample preparation

• Versatile electrical characterization of even the most challenging structures

• Liquid injection, beam induced gas deposition, & charge compensation

• In-situ mechanical experiments enabling nanoindentation, tensile measurements, & nanoforging

Probe single cells and target sub-cellular structures using specialized tools for:

• Precision in-vitro & in-vivo patch clamp studies

• Push-pull technique & mechanical stimulation experiments

• Micro dissection of chromosomes

• Targeted cryo lift-out and specimen manipulation in low vacuum SEM