Speed up your R&D and resolve yield challenges with our advanced tools for semiconductor process control & failure analysis:

• Fault isolation from µm down to n5 with nanoprobing, current imaging, and EBIC/EBAC/RCI
• Physical failure analysis with ex-situ and in-situ lift-out
• SEM-AFM, e-beam lithography, & microcleaning

Discover new insights in surface & nanoscience using our wide range of SEM based tools for:

• Point-and-click nanomanipulation, APT, & TEM sample preparation
• Versatile electrical characterization of even the most challenging structures
• Liquid injection, beam induced gas deposition, & charge compensation
• In-situ mechanical experiments enabling nanoindentation, tensile measurements, & nanoforging

Probe single cells and target sub-cellular structures using specialized tools for:

• Precision in-vitro & in-vivo patch clamp studies
• Push-pull technique & mechanical stimulation experiments
• Micro dissection of chromosomes
• Targeted cryo lift-out and specimen manipulation in low vacuum SEM